Failure analysis of cracked Brass turrets used in electronic circuits

A new paper in « Case study in Engineering Failure Analysis » published on ScienceDirect.com.

This paper describes cracking of turret terminals made of free cutting brass during swaging operation. The crack propagation tendency during cold working of brass turret terminals made from different compositions is studied through optical and scanning electron microscopy. Finally, composition for obtaining crack free terminals during swaging is suggested for applications involving cold swaging.

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